Spectroscopic ellipsometry study of the layer structure and impurity content in Er-doped nanocrystalline silicon thin films

Authors: Losurdo M., Cerqueira M.F., Stepikhova M.V., Alves E., Giangregorio M.M., Pinto P., Ferreira J.A.
Years: 2001
Source Title:
Doi: 10.1016/S0921-4526(01)00704-9
Venue: NanoChem @ URT Bari