Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices

Authors: Losurdo M., Giuva D., Giangregorio M.M., Bruno G., Brown A.S.
Years: 2004
Source Title:
Doi: 10.1016/j.tsf.2003.11.286
Venue: NanoChem @ URT Bari