Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: State-of-the-art, potential, and perspectives

Authors: Losurdo M., Bergmair M., Bruno G., Cattelan D., Cobet C., De Martino A., Fleischer K., Dohcevic-Mitrovic Z., Esser N., Galliet M., Gajic R., Hemzal D., Hingerl K., Humlicek J., Ossikovski R., Popovic Z.V., Saxl O.
Years: 2009
Source Title:
Doi: 10.1007/s11051-009-9662-6
Venue: NanoChem @ URT Bari