Observation of ultrahigh quality factor in a semiconductor microcavity

Authors: Sanvitto D., Daraei A., Tahraoui A., Hopkinson M., Fry P.W., Whittaker D.M., Skolnick M.S.
Years: 2005
Source Title: Applied Physics Letters
Doi: 10.1063/1.1925774
Venue: CNR Nanotec @ Lecce