Negative bias-temperature stress in non-self-aligned p-channel polysilicon TFTs

Authors: Mariucci L., Gaucci P., Valletta A., Cuscuna M., Maiolo L., Pecora A., Fortunato G.
Years: 2009
Source Title: Thin Solid Films
Doi: 10.1016/j.tsf.2009.02.089
Venue: CNR Nanotec @ Lecce