Interrelation between nanostructure and optical properties of oxide thin films by spectroscopic ellipsometry

Authors: Losurdo M., Barreca D., Capezzuto P., Bruno G., Tondello E.
Years: 2002
Source Title:
Doi: 10.1016/S0257-8972(01)01617-6
Venue: NanoChem @ URT Bari