In situ spectroscopic ellipsometry to monitor surface plasmon resonant group-III metals deposited by molecular beam epitaxy

Authors: Wu P.C., Losurdo M., Kim T.-H., Choi S., Bruno G., Brown A.S.
Years: 2007
Source Title:
Doi: 10.1116/1.2734163
Venue: NanoChem @ URT Bari