XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface

Authors: Chiarello, G; Barberi, R; Amoddeo, A; Caputi, LS; Colavita, E
Years: 1996
Source Title: APPLIED SURFACE SCIENCE
Doi: 10.1016/0169-4332(95)00451-3
Venue: LiCryL @ Rende (CS)