X-ray study of the roughness of surfaces and interfaces

Authors: Kozhevnikov Igor V., Asadchikov Victor E., Bukreeva Inna N., Duparre Angela, Krivonosov Yury S., Morawe Christian, Ostashev Vladimir I., Pyatakhin Mikhail V., Ziegler Eric
Years: 2000
Source Title: Proceedings of SPIE – The International Society for Optical Engineering
Doi: 10.1117/12.405809
Venue: S.Li.M. Lab @ Roma