X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

Authors: Pelliccia D., Sorrentino A., Bukreeva I., Cedola A., Scarinci F., Ilie M., Gerardino A.M., Fratini M., Lagomarsino S.
Years: 2010
Source Title: Optics Express
Doi: 10.1364/OE.18.015998
Venue: S.Li.M. Lab @ Roma