X-ray diffraction imaging provides nanometer spatial resolution for strain determination

Authors: Di Fonzo, S; Jark, W; Lagomarsino, S; Giannini, C; De Caro, L; Cedola, A; Muller, M
Years: 2000
Source Title: X-RAY MICROSCOPY, PROCEEDINGS
Doi:
Venue: S.Li.M. Lab @ Roma