Threshold voltage in short channel polycrystalline silicon thin film transistors: Influence of drain induced barrier lowering and floating body effects

Authors: Valletta A., Gaucci P., Mariucci L., Pecora A., Cuscun M., Maiolo L., Fortunato G.
Years: 2010
Source Title: Journal of Applied Physics
Doi: 10.1063/1.3359649
Venue: CNR Nanotec @ Lecce