Structural, optical, and electrical characterization of ZnO and Al-doped ZnO thin films deposited by MOCVD

Authors: Fragala M.E., Malandrino G., Giangregorio M.M., Losurdo M., Bruno G., Lettieri S., Amato L.S., Maddalena P.
Years: 2009
Source Title:
Doi: 10.1002/cvde.200906790
Venue: NanoChem @ URT Bari