Spectroscopic ellipsometry study of interfaces and crystallization behavior during annealing of a-Si:H films

Authors: Losurdo M., Roca F., De Rosa R., Capezzuto P., Bruno G.
Years: 2001
Source Title:
Doi: 10.1016/S0040-6090(00)01616-3
Venue: NanoChem @ URT Bari