Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films

Authors: Losurdo M., Giangregorio M.M., Capezzuto P., Bruno G., Babudri F., Colangiuli D., Farinola G.M., Naso F.
Years: 2003
Source Title:
Doi: 10.1016/S0379-6779(02)01262-6
Venue: NanoChem @ URT Bari