Recent advances in characterization of CaCu3Ti4O 12 thin films by spectroscopic ellipsometric metrology

Authors: Lo Nigro R., Malandrino G., Toro R.G., Losurdo M., Bruno G., Fragala I.L.
Years: 2005
Source Title:
Doi: 10.1021/ja0541229
Venue: NanoChem @ URT Bari