Parametrization of optical properties of indium-tin-oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity

Authors: Losurdo M., Giangregorio M., Capezzuto P., Bruno G., De Rosa R., Roca F., Summonte C., Pla J., Rizzoli R.
Years: 2002
Source Title:
Doi: 10.1116/1.1421596
Venue: NanoChem @ URT Bari