Innovative instrumentation for HTRB tests on semiconductor power devices

Authors: Consentino G., De Pasquale D., Galiano S., D’Ignoti A., Pace C., Hernandez Ambato J.L., Mazzeo M., Giordano C.
Years: 2013
Source Title: AEIT Annual Conference 2013: Innovation and Scientific and Technical Culture for Development, AEIT 2013 – Selected Proceedings Papers
Doi:
Venue: CNR Nanotec @ Lecce