High resolution phase contrast microscopy with a hard x-ray waveguide

Authors: Cedola A., Cloetens P., Di Fonzo S., Jark W., Lagomarsino S., Soullie G., Riekel C.
Years: 1997
Source Title: Proceedings of SPIE – The International Society for Optical Engineering
Doi: 10.1117/12.279388
Venue: S.Li.M. Lab @ Roma