Hard x-ray contact microscopy with 250 nm spatial resolution using a LiF film detector and a tabletop microsource

Authors: Almaviva S., Bonfigli F., Franzini I., Lai A., Montereali R.M., Pelliccia D., Cedola A., Lagomarsino S.
Years: 2006
Source Title: Applied Physics Letters
Doi: 10.1063/1.2236283
Venue: S.Li.M. Lab @ Roma