Electromagnetic field resonance in thin amorphous films: A tool for nondestructive localization of thin marker layers by use of a standard X-ray tube

Authors: Di Fonzo S., Jark W., Lagomarsino S., Cedola A., Muller B.R., Pelka J.B.
Years: 1996
Source Title: Thin Solid Films
Doi:
Venue: S.Li.M. Lab @ Roma