Edge effects in self-heating-related instabilities in p-Channel polycrystalline-silicon thin-film transistors

Authors: Mariucci L., Gaucci P., Valletta A., Pecora A., Maiolo L., Cuscuna M., Fortunato G.
Years: 2011
Source Title: IEEE Electron Device Letters
Doi: 10.1109/LED.2011.2169040
Venue: CNR Nanotec @ Lecce