Dangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis

Authors: Consentino G., Laudani M., Privitera G., Parlato A., Marchese N., Tomarchio E., Pace C., Giordano C., Mazzeo M., Ambato J.L.H.
Years: 2013
Source Title: AEIT Annual Conference 2013: Innovation and Scientific and Technical Culture for Development, AEIT 2013 – Selected Proceedings Papers
Venue: CNR Nanotec @ Lecce