Analysis of self-heating related instability in n-channel polysilicon thin film transistors fabricated on polyimide

Authors: Maiolo L., Cuscuna M., Mariucci L., Minotti A., Pecora A., Simeone D., Valletta A., Fortunato G.
Years: 2009
Source Title: Thin Solid Films
Doi: 10.1016/j.tsf.2009.02.105
Venue: CNR Nanotec @ Lecce