An automatic analysis of strain-depth profile in X-ray microdiffraction

Authors: Lagomarsino S., Giannini C., Guagliardi A., Cedola A., Scarinci F., Aruta C.
Years: 2004
Source Title: Physica B: Condensed Matter
Doi: 10.1016/j.physb.2004.09.065
Venue: S.Li.M. Lab @ Roma