A Scanning electron and atomic force microscopy study of the surface morphology and composition of CsI films as affected by evaporation rate and humid-air exposure

Authors: Senesi G.S., Nitti M.A., Valentini A.
Years: 2005
Source Title: Microscopy and Microanalysis
Doi: 10.1017/S143192760505018X
Venue: P.LAS.M.I. Lab @ Bari